Reconstruction of tomographic images corrupted by a slice sensitivity profile with applications to the inspection of manufactured items

Reconstruction of tomographic images corrupted by a slice sensitivity profile with applications to the inspection of manufactured items

Swoboda, John

Electrical engineering

May 2008

School of Engineering

Rensselaer Polytechnic Institute, Troy, NY

Saulnier, Gary J.

Holmes, Timothy

2008-05

Electronic thesis

ENG

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