First principles study of size and strain effects on the electronic properties of Si and SiC nanostructures

First principles study of size and strain effects on the electronic properties of Si and SiC nanostructures

Peng, Xihong

Physics

August 2007

School of Science

Rensselaer Polytechnic Institute, Troy, NY

Nayak, Saroj K.

Kumar, Sanat K.

Lu, T.-M. (Toh-Ming), 1943-

Persans, Peter D., 1953-

Korniss, Gyorgy

Alizadeh, Azar

2007-08

Electronic thesis

ENG

This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.

Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.