High speed on-chip interconnect modeling and reliability assessment

High speed on-chip interconnect modeling and reliability assessment

Diao, Jiedong

Electrical, computer, and systems engineering

December 2006

School of Engineering

Rensselaer Polytechnic Institute, Troy, NY

McDonald, John F. (John Francis), 1942-

Le Coz, Yannick L.

Zhang, Tong

Lu, T.-M. (Toh-Ming), 1943-

2006-12

Electronic thesis

ENG

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