Degradation modeling using threshold exceedance data

Degradation modeling using threshold exceedance data

Fan, Hui

Systems engineering

May 2007

School of Engineering

Rensselaer Polytechnic Institute, Troy, NY

Willemain, Thomas R.

Osborn, Brock E.

Sullo, Pasquale

Paulson, A. S.

Chan, Wai Kin (Victor)

2007-05

Electronic thesis

ENG

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